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案件記録

METHOD FOR GENERATING PATTERNING DEVICE PATTERN AT PATCH BOUNDARY

発明審査中
1閲覧数
21請求項 · 4 独立
§ Ⅰ

案件概要

発明者

Quan ZHANG; Yong-Ju CHO; Zhangnan ZHU; Boyang HUANG; Been-Der CHEN

IPC分類

G6F 30/398G3F 1/36G3F 1/44G3F 1/70G3F 7/G6F 119/18

CPC分類

G6F30/398G3F1/36G3F1/70G3F7/70441G3F1/44G6F2119/18

A method for generating a mask pattern to be employed in a patterning process. The method including obtaining (i) a first feature patch including a first polygon portion of an initial mask pattern, and (ii) a second feature patch including a second polygon portion of the initial mask pattern; adjusting the second polygon portion at a patch boundary between the first feature patch and the second feature patch such that a difference between the first polygon portion and the second polygon portion at the patch boundary is reduced; and combining the first polygon portion and the adjusted second polygon portion at the patch boundary to form the mask pattern.

原文(中国語)

A method for generating a mask pattern to be employed in a patterning process. The method including obtaining (i) a first feature patch including a first polygon portion of an initial mask pattern, and (ii) a second feature patch including a second polygon portion of the initial mask pattern; adjusting the second polygon portion at a patch boundary between the first feature patch and the second feature patch such that a difference between the first polygon portion and the second polygon portion at the patch boundary is reduced; and combining the first polygon portion and the adjusted second polygon portion at the patch boundary to form the mask pattern.

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