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案件記録

METHOD FOR AUTOMATED GRAIN MAPPING

発明審査中
1閲覧数
19請求項 · 2 独立
§ Ⅰ

案件概要

発明者

Ryan C. Breneman; Kyle Ingram

IPC分類

G6T 17/G6V 10/141

CPC分類

G6T17/G6V10/141

A method for grain mapping of a surface of a component includes the steps of constructing a model comprising a three-dimensional scanned model of the component; scanning the component with RGB light to obtain an RGB light scan; applying the RGB light scan to the three-dimensional scanned model of the component to produce a combined three-dimensional model of the component with an RGB light scan overlay on the three-dimensional model; and analyzing the combined three-dimensional model of the component with the RGB light scan overlay on the three-dimensional model to identify grain boundaries in the component.

原文(中国語)

A method for grain mapping of a surface of a component includes the steps of constructing a model comprising a three-dimensional scanned model of the component; scanning the component with RGB light to obtain an RGB light scan; applying the RGB light scan to the three-dimensional scanned model of the component to produce a combined three-dimensional model of the component with an RGB light scan overlay on the three-dimensional model; and analyzing the combined three-dimensional model of the component with the RGB light scan overlay on the three-dimensional model to identify grain boundaries in the component.

外部リソース