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案件記録

THERMAL-PROCESS APPARATUSES AND METHODS TO REDUCE PROCESS-RELATED THERMAL SHRINKAGE

発明審査中
2閲覧数
20請求項 · 3 独立
§ Ⅰ

案件概要

発明者

Seth J. Bamesberger; Alex Ruiz; David Matthew Galvin; William P. Morey

IPC分類

H1L 21/687H1L 21/324H1L 21/67

CPC分類

H1L21/68742H1L21/324H1L21/67103

Some embodiments of a thermal module for baking a wafer in a low oxygen environment comprise a hot plate, a movable chamber lid having a recessed region defined by a chamber ceiling and a chamber sidewall for receiving a wafer, and lift pins for raising or lowering the wafer above or onto the hot plate. The recessed region is configured such that, when the wafer is positioned in the recessed region, a narrow gap is formed between the wafer and the recessed region such that a low oxygen environment between the chamber ceiling and a proximal surface of the wafer can be retained.

原文(中国語)

Some embodiments of a thermal module for baking a wafer in a low oxygen environment comprise a hot plate, a movable chamber lid having a recessed region defined by a chamber ceiling and a chamber sidewall for receiving a wafer, and lift pins for raising or lowering the wafer above or onto the hot plate. The recessed region is configured such that, when the wafer is positioned in the recessed region, a narrow gap is formed between the wafer and the recessed region such that a low oxygen environment between the chamber ceiling and a proximal surface of the wafer can be retained.

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