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案件記録

TEMPERATURE MEASUREMENT DEVICE FOR MEASURING A SURFACE TEMPERATURE OF A SEMICONDUCTOR PACKAGE

発明審査中
20請求項 · 3 独立
§ Ⅰ

案件概要

発明者

Eyal Hamo; Eran Moshe; Apratim Sanyal

IPC分類

H1L 23/34H1L 21/66H1L 23/H1L 23/31H1L 25/65H10B 80/

CPC分類

H1L23/34H1L22/32H1L23/3135H1L25/657H10B80/H1L24/13H1L24/48H1L2224/13023H1L2224/48148H1L2224/48228H1L2225/6506H1L2924/1438

A semiconductor package includes at least one internal temperature sensor to detect an operating temperature of the semiconductor package. The operating temperature is based on a surface temperature of an enclosure of the semiconductor package. As such, the at least one internal temperature sensor is positioned within a cavity defined by the enclosure to measure the temperature of the enclosure. The at least one internal temperature sensor can be coupled to an inner side of the enclosure or it can be proximate to the enclosure. Temperature measurements provided by the at least one internal temperature sensor are used to determine whether the semiconductor package is operating within operating temperature ranges specified by one or more standards.

原文(中国語)

A semiconductor package includes at least one internal temperature sensor to detect an operating temperature of the semiconductor package. The operating temperature is based on a surface temperature of an enclosure of the semiconductor package. As such, the at least one internal temperature sensor is positioned within a cavity defined by the enclosure to measure the temperature of the enclosure. The at least one internal temperature sensor can be coupled to an inner side of the enclosure or it can be proximate to the enclosure. Temperature measurements provided by the at least one internal temperature sensor are used to determine whether the semiconductor package is operating within operating temperature ranges specified by one or more standards.

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