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案件記録

SUBSTRATE STRUCTURE AND MANUFACTURING METHOD THEREOF

発明審査中
1閲覧数
20請求項 · 2 独立
§ Ⅰ

案件概要

発明者

Meng-Jou HE; Yuan-Ping YEH; Yu-Cheng PAI

IPC分類

H1L 23/H1L 23/538

CPC分類

H1L24/9H1L23/5383H1L23/5384H1L2224/6102H1L2224/65

A substrate structure and a manufacturing method thereof are provided, in which a core layer having first and second connection pads is formed, and first bonding pads of a first circuit build-up layer and second bonding pads of a second circuit build-up layer are respectively bonded to the first connection pads and the second connection pads, so that the first circuit build-up layer and the second circuit build-up layer are respectively located on a first side and a second side of the core layer, and a first gap is formed between the first side and the first circuit build-up layer, and a second gap is formed between the second side and the second circuit build-up layer. Thereby, the core layer and the first and second circuit build-up layers can be manufactured separately and concurrently, thereby shortening the manufacturing process of the substrate structure and improving the yield of the substrate structure.

原文(中国語)

A substrate structure and a manufacturing method thereof are provided, in which a core layer having first and second connection pads is formed, and first bonding pads of a first circuit build-up layer and second bonding pads of a second circuit build-up layer are respectively bonded to the first connection pads and the second connection pads, so that the first circuit build-up layer and the second circuit build-up layer are respectively located on a first side and a second side of the core layer, and a first gap is formed between the first side and the first circuit build-up layer, and a second gap is formed between the second side and the second circuit build-up layer. Thereby, the core layer and the first and second circuit build-up layers can be manufactured separately and concurrently, thereby shortening the manufacturing process of the substrate structure and improving the yield of the substrate structure.

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