SEMICONDUCTOR DEVICE INCLUDING A TIERED STRUCTURE HAVING TAPERED FILL STRUCTURES
案件概要
発明者
Collin HOWDER; Justin SHEPHERDSON; Christopher BREYFOGLE
IPC分類
CPC分類
Implementations described herein relate to various structures, integrated assemblies, and memory devices. In some implementations, a memory device includes a vertically-oriented contact pillar and a tiered structure proximate to the vertically-oriented contact pillar. The tiered structure includes an access line between two insulative layers and insulative fill structure. The insulative fill structure includes a tapered portion that is between the vertically-oriented contact pillar and the access line. The tapered portion may be between facing surfaces of ends of the insulative layers.
原文(中国語)
Implementations described herein relate to various structures, integrated assemblies, and memory devices. In some implementations, a memory device includes a vertically-oriented contact pillar and a tiered structure proximate to the vertically-oriented contact pillar. The tiered structure includes an access line between two insulative layers and insulative fill structure. The insulative fill structure includes a tapered portion that is between the vertically-oriented contact pillar and the access line. The tapered portion may be between facing surfaces of ends of the insulative layers.
外部リソース