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案件記録

THIN FILM TRANSISTORS HAVING ETCHED CONTACT METALLIZATION

発明審査中
3閲覧数
20請求項 · 3 独立
§ Ⅰ

案件概要

発明者

Honore DJIEUTEDJEU; Abhishek Anil SHARMA; Van H. LE; Vinaykumar HADAGALI; Nikhil MEHTA; Yu-Wen HUANG; Umang DESAI; Christopher J. WIEGAND

IPC分類

H1L 29/417H1L 27/88H1L 29/49H1L 29/786

CPC分類

H10D30/6729H10D30/6757H10D64/665H10D84/83

Thin film transistors are described. An integrated circuit structure includes a gate electrode. A gate dielectric layer is on the gate electrode. A channel material layer is on the gate dielectric layer. Source or drain contacts are on the channel material layer. Each of the source or drain contacts has sidewalls which taper outwardly from a top of the source or drain contact to a bottom of the source or drain contact.

原文(中国語)

Thin film transistors are described. An integrated circuit structure includes a gate electrode. A gate dielectric layer is on the gate electrode. A channel material layer is on the gate dielectric layer. Source or drain contacts are on the channel material layer. Each of the source or drain contacts has sidewalls which taper outwardly from a top of the source or drain contact to a bottom of the source or drain contact.

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