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案件記録

L-SHAPED STACKED FIELD EFFECT TRANSISTOR

発明審査中
2閲覧数
20請求項 · 2 独立
§ Ⅰ

案件概要

発明者

Chen Zhang; Ruilong Xie; Abir Shadman; Shahrukh Khan; Junli Wang

IPC分類

H1L 29/423H1L 27/92H1L 29/6H1L 29/66H1L 29/775H1L 29/786

CPC分類

H10D30/6735H10D30/14H10D30/43H10D30/6757H10D62/115H10D62/121H10D84/853

Embodiments of the present disclosure are directed to L-shaped stacked field effect transistor (SFET) processing methods and resulting structures having separate top and bottom self-aligned contact (SAC) caps. In a non-limiting embodiment, a first nanosheet stack having a first nanosheet and a second nanosheet stack having a second nanosheet are vertically stacked. A gate is formed around a channel region of the first nanosheet and a channel region of the second nanosheet. The gate includes a first portion recessed to a first gate height and a second portion recessed to a second gate height less than the first gate height. A bottom self-aligned contact cap is formed on the second portion of the gate and a top self-aligned contact cap is formed on the first portion of the gate.

原文(中国語)

Embodiments of the present disclosure are directed to L-shaped stacked field effect transistor (SFET) processing methods and resulting structures having separate top and bottom self-aligned contact (SAC) caps. In a non-limiting embodiment, a first nanosheet stack having a first nanosheet and a second nanosheet stack having a second nanosheet are vertically stacked. A gate is formed around a channel region of the first nanosheet and a channel region of the second nanosheet. The gate includes a first portion recessed to a first gate height and a second portion recessed to a second gate height less than the first gate height. A bottom self-aligned contact cap is formed on the second portion of the gate and a top self-aligned contact cap is formed on the first portion of the gate.

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