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案件記録

SACRIFICIAL RIBBON FOR UNIFORM WORKFUNCTION AND CAPACITANCE BENEFITS

発明審査中
1閲覧数
20請求項 · 3 独立
§ Ⅰ

案件概要

発明者

Tao Chu; Guowei Xu; Robin Chao; Feng Zhang; Ting-Hsiang Hung; Chia-Ching Lin; Yang Zhang; Kan Zhang; Chun Wing Yeung; Minwoo Jang; Yanbin Luo; Paul Packan; Chung-Hsun Lin; Anand Murthy

IPC分類

H1L 29/49H1L 21/8238H1L 27/92H1L 29/6H1L 29/423H1L 29/66H1L 29/778H1L 29/786

CPC分類

H10D30/6739H10D30/47H10D30/6735H10D30/6757H10D62/118H10D64/17H10D84/167H10D84/38H10D84/85

Integrated circuit (IC) devices having gate-all-around field-effect transistors with nanoribbon channels through gate electrodes. An IC device has a stack of nanoribbon channels through a gate electrode, and the gate electrode has uniform gate thicknesses of gate metal and dielectric layers between, over, and under each of the nanoribbons. The nanoribbons extend between pairs of gate spacers to couple source and drain bodies, with pairs of matching gate spacers over and under each of the nanoribbons. A pair of second gate spacers are on and over an uppermost pair of the first gate spacers. A sacrificial cap layer is deployed over an uppermost of the channel layers during processing, and end portions of cap layer are retained as the second gate spacers.

原文(中国語)

Integrated circuit (IC) devices having gate-all-around field-effect transistors with nanoribbon channels through gate electrodes. An IC device has a stack of nanoribbon channels through a gate electrode, and the gate electrode has uniform gate thicknesses of gate metal and dielectric layers between, over, and under each of the nanoribbons. The nanoribbons extend between pairs of gate spacers to couple source and drain bodies, with pairs of matching gate spacers over and under each of the nanoribbons. A pair of second gate spacers are on and over an uppermost pair of the first gate spacers. A sacrificial cap layer is deployed over an uppermost of the channel layers during processing, and end portions of cap layer are retained as the second gate spacers.

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