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案件記録

GATE-CONTROLLED SEMICONDUCTOR DEVICES HAVING TEMPERATURE COMPENSATED GATE RESISTANCES

発明審査中
3閲覧数
28請求項 · 11 独立
§ Ⅰ

案件概要

IPC分類

H1L 29/43

CPC分類

H10D64/605

Semiconductor devices comprise a semiconductor layer structure and a gate structure that comprises a high resistance portion and a low-resistance portion on the semiconductor layer structure. The high resistance portion of the gate structure comprises a first section that has a first resistance temperature coefficient and a second section that has a second resistance temperature coefficient that differs from the first resistance temperature coefficient.

原文(中国語)

Semiconductor devices comprise a semiconductor layer structure and a gate structure that comprises a high resistance portion and a low-resistance portion on the semiconductor layer structure. The high resistance portion of the gate structure comprises a first section that has a first resistance temperature coefficient and a second section that has a second resistance temperature coefficient that differs from the first resistance temperature coefficient.

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