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案件記録

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

発明審査中
10請求項 · 2 独立
§ Ⅰ

案件概要

IPC分類

H10D 84/H10D 8/H10D 8/1H10D 12/H10D 12/1H10D 62/10H10D 62/60

CPC分類

H10D84/161H10D8/45H10D8/422H10D12/38H10D12/415H10D12/481H10D62/107H10D62/124H10D62/60

A semiconductor device includes: a drift layer of a first conductivity-type provided in an active area and an edge termination area surrounding the active area; a base region of a second conductivity-type provided on a top surface side of the drift layer in the active area; a main region of the first conductivity-type provided on a top surface side of the base region; and an insulated gate electrode structure provided in contact with the main region and the base region, wherein an effective carrier concentration in the base region is relatively high in a middle part of the active area and is relatively low in a circumferential part of the active area, and a depth of a peak concentration in the base region is deeper than a bottom surface of the main region.

原文(中国語)

A semiconductor device includes: a drift layer of a first conductivity-type provided in an active area and an edge termination area surrounding the active area; a base region of a second conductivity-type provided on a top surface side of the drift layer in the active area; a main region of the first conductivity-type provided on a top surface side of the base region; and an insulated gate electrode structure provided in contact with the main region and the base region, wherein an effective carrier concentration in the base region is relatively high in a middle part of the active area and is relatively low in a circumferential part of the active area, and a depth of a peak concentration in the base region is deeper than a bottom surface of the main region.

外部リソース