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案件記録

SEMICONDUCTOR DEVICES WITH INSULATION FEATURES

発明審査中
2閲覧数
20請求項 · 3 独立
§ Ⅰ

案件概要

発明者

Tzu-Ging Lin; Yun-Chen Wu; Bing-Hung Chen

IPC分類

H1L 27/92H1L 21/28H1L 21/8238H1L 29/6H1L 29/423H1L 29/66H1L 29/775H1L 29/786

CPC分類

H10D84/85H1L21/28123H10D30/14H10D30/43H10D30/6735H10D30/6757H10D62/121H10D64/17H10D84/188H10D84/38

Semiconductor devices with insulation structures and methods of fabrication are provided. A semiconductor device includes a first fin structure located over a substrate; a first gate segment located over the first fin structure; a second fin structure located over the substrate; a second gate segment located over the second fin structure; and an insulation feature located between the first fin structure and the second fin structure and located between the first gate segment and the second gate segment, wherein the insulation feature extends laterally from a first sidewall nearest the first gate segment to a second sidewall nearest the second gate segment; wherein the insulation feature includes a bottom layer and a top layer located over the bottom layer; and wherein the top layer forms an uppermost surface of the insulation feature.

原文(中国語)

Semiconductor devices with insulation structures and methods of fabrication are provided. A semiconductor device includes a first fin structure located over a substrate; a first gate segment located over the first fin structure; a second fin structure located over the substrate; a second gate segment located over the second fin structure; and an insulation feature located between the first fin structure and the second fin structure and located between the first gate segment and the second gate segment, wherein the insulation feature extends laterally from a first sidewall nearest the first gate segment to a second sidewall nearest the second gate segment; wherein the insulation feature includes a bottom layer and a top layer located over the bottom layer; and wherein the top layer forms an uppermost surface of the insulation feature.

外部リソース