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案件記録

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

発明審査中
3閲覧数
11請求項 · 3 独立
§ Ⅰ

案件概要

発明者

Shunpei YAMAZAKI; Jun KOYAMA; Hiroyuki MIYAKE

IPC分類

H10D 86/60H1L 21/2H10D 30/67H10D 62/40H10D 62/80H10D 84/84H10D 86/1H10D 86/40

CPC分類

H10D86/60H10D30/6732H10D30/6745H10D30/6746H10D30/6755H10D30/6756H10D30/6757H10D62/405H10D62/80H10D84/84H10D86/221H10D86/231H10D86/423H10D86/471H1L21/2603H1L2924/13069H10D30/6739H10D62/40

An oxide semiconductor layer which is intrinsic or substantially intrinsic and includes a crystalline region in a surface portion of the oxide semiconductor layer is used for the transistors. An intrinsic or substantially intrinsic semiconductor from which an impurity which is to be an electron donor (donor) is removed from an oxide semiconductor and which has a larger energy gap than a silicon semiconductor is used. Electrical characteristics of the transistors can be controlled by controlling the potential of a pair of conductive films which are provided on opposite sides from each other with respect to the oxide semiconductor layer, each with an insulating film arranged therebetween, so that the position of a channel formed in the oxide semiconductor layer is determined.

原文(中国語)

An oxide semiconductor layer which is intrinsic or substantially intrinsic and includes a crystalline region in a surface portion of the oxide semiconductor layer is used for the transistors. An intrinsic or substantially intrinsic semiconductor from which an impurity which is to be an electron donor (donor) is removed from an oxide semiconductor and which has a larger energy gap than a silicon semiconductor is used. Electrical characteristics of the transistors can be controlled by controlling the potential of a pair of conductive films which are provided on opposite sides from each other with respect to the oxide semiconductor layer, each with an insulating film arranged therebetween, so that the position of a channel formed in the oxide semiconductor layer is determined.

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