検索に戻る
案件記録

Abnormality detection method, abnormality detection device, electric appliance and readable storage medium

その他/未提供不明

データ提供元:EPO OPS

本文を取得できませんでした。取得済みの書誌情報は引き続き確認できます。

92392656ファミリー
§ Ⅰ

案件概要

出願人

GUANDONG MIDEA HVAC EQUIPMENT; MIDEA GROUP CO LTD

出願番号

CN202410597750

発明者

LI BIN; ZHAO HAOWEI; LI DONGDONG; JI XUEHUAN; ZHENG CHUNYUAN

出願日

May 14, 2024

公開日

Aug 23, 2024

パテントファミリーID

92392656

IPC分類

F04B49/06F04B51/00F24F11/38F24F11/61F24F11/64

CPC分類

F04B49/065F04B51/00F24F11/38F24F11/61F24F11/64

The invention discloses an anomaly detection method, an anomaly detection device, an electric appliance and a nonvolatile computer readable storage medium. The method comprises the following steps: acquiring the operation power of an electric appliance with the operation duration within a preset duration interval, and determining a basic deviation ratio according to the operation power and a preset power threshold value; determining a current deviation rate according to the current power of the electric appliance and a preset power threshold; and performing anomaly detection based on the deviation between the current deviation rate and the basic deviation rate to determine an anomaly detection result. The preset duration interval can be set according to the preset duration corresponding to the working performance of the electric appliance in the reasonable range, so that the basic deviation rate can be understood as the allowable deviation rate of the electric appliance. It can be understood that when the deviation shows that the difference between the current deviation rate and the basic deviation rate is large, it can be confirmed that the working performance of the electric appliance is abnormal at the moment. Therefore, the working performance of the electric appliance can be monitored at any time in the operation process of the electric appliance, so that the abnormal information of the working performance of the electric appliance can be obtained in time.

EPO 調査資料

項目を選択すると、この公開文献の公式資料を取得します。

上の項目を選択して資料を取得してください。

特許調査ツール

外部リソース