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案件記録

Method and device for detecting surface defects of product

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89705071ファミリー
§ Ⅰ

案件概要

出願人

NINGDE CONTEMPORARY AMPEREX TECH CO LTD

出願番号

CN20228091450

発明者

CHEN XIAOYI; JIANG GUANNAN; CHEN FEI

出願日

Jul 29, 2022

公開日

Sep 24, 2024

パテントファミリーID

89705071

IPC分類

G06N3/0464G06N3/08G06T7/00G06T7/11G06V10/40

CPC分類

G06N3/04G06N3/08G06T7/00G06V10/40

The invention discloses a method and a device for detecting surface defects of a product, which can reduce the calculated amount and improve the detection efficiency while accurately segmenting a defect area on the surface of the product. The method for detecting surface defects of a product comprises: acquiring a first picture of a product (S210); according to the first picture and a region segmentation model, obtaining a defect region of the product (S220), the region segmentation model comprising a plurality of data processing layers, the plurality of data processing layers being connected by performing sampling calculation on data to be sampled, the to-be-sampled data of the at least one data processing layer is obtained by splicing first intermediate data generated by input data of the data processing layer and second intermediate data generated by the first intermediate data.

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