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기록

SUBSTRATE SEPARATION APPARATUS AND CONTROL METHOD THEREOF

발명심사 중
11청구항 · 2 독립항
§ Ⅰ

개요

발명자

Sung Won MO; Seung Hoon LEE; Heung Soo HAN; Jin Uk KIM; Yu Jin PARK

IPC 분류

B32B 43/

CPC 분류

B32B43/6B32B2309/72

The present invention relates to a substrate separation apparatus, and the substrate separation apparatus includes a separation member () that enters a bonded portion () of a bonded substrate () in which a first substrate () and a second substrate () are bonded, and forms a crack, a sensor module () configured to photograph the bonded substrate () and the separation member () to obtain measurement values corresponding to distances from the sensor module () to the bonded substrate () and the separation member (), and a processor () configured to move the separation member () to a height of the bonded portion () on the basis of the measurement values.

원문 (중국어)

The present invention relates to a substrate separation apparatus, and the substrate separation apparatus includes a separation member () that enters a bonded portion () of a bonded substrate () in which a first substrate () and a second substrate () are bonded, and forms a crack, a sensor module () configured to photograph the bonded substrate () and the separation member () to obtain measurement values corresponding to distances from the sensor module () to the bonded substrate () and the separation member (), and a processor () configured to move the separation member () to a height of the bonded portion () on the basis of the measurement values.