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기록

SENSOR WITH MICROSTRUCTURE

발명심사 중
2조회수
13청구항 · 3 독립항
§ Ⅰ

개요

IPC 분류

G1L 1/22H1C 17/65

CPC 분류

G1L1/2287G1L1/2268H1C17/65

A force sensor () and a method for measuring a force are disclosed. The force sensor () comprises a first non-conductive substrate () and a second non-conductive substrate (). A first electrode () and a second electrode () are disposed on the first substrate () and offset to each other. A first conductive layer () is disposed on the first substrate () and is conductively connecting the first electrode () and the second electrode () with a first layer resistance (R). A second conductive layer () is disposed on the second substrate (). The second conductive layer () is configured to conductively connect the first electrode () and the second electrode () via the second conductive layer () with a second layer resistance (R) when the first non-conductive substrate () and the second non-conductive substrate () approach each other.

원문 (중국어)

A force sensor () and a method for measuring a force are disclosed. The force sensor () comprises a first non-conductive substrate () and a second non-conductive substrate (). A first electrode () and a second electrode () are disposed on the first substrate () and offset to each other. A first conductive layer () is disposed on the first substrate () and is conductively connecting the first electrode () and the second electrode () with a first layer resistance (R). A second conductive layer () is disposed on the second substrate (). The second conductive layer () is configured to conductively connect the first electrode () and the second electrode () via the second conductive layer () with a second layer resistance (R) when the first non-conductive substrate () and the second non-conductive substrate () approach each other.