SYSTEMS AND METHODS FOR FRAME CONTROL IN TEXTURE ANALYSIS
개요
발명자
William Carl LENTHE; Stuart Ian WRIGHT
IPC 분류
CPC 분류
A system may obtain a plurality of experimental diffraction patterns. A system may identify a crystallographic orientation of each diffraction pattern of the plurality of experimental diffraction patterns. A system may build one or more pole figures. A system may select a reference spherical function having a reference frame. A system may correlate spherical images from the pole figures and the reference spherical function. A system may determine a sample frame of the crystallographic orientations. A system may rotate the crystallographic orientations of the plurality of experimental diffraction patterns into alignment with the reference frame to produce a plurality of rotated crystallographic orientations.
원문 (중국어)
A system may obtain a plurality of experimental diffraction patterns. A system may identify a crystallographic orientation of each diffraction pattern of the plurality of experimental diffraction patterns. A system may build one or more pole figures. A system may select a reference spherical function having a reference frame. A system may correlate spherical images from the pole figures and the reference spherical function. A system may determine a sample frame of the crystallographic orientations. A system may rotate the crystallographic orientations of the plurality of experimental diffraction patterns into alignment with the reference frame to produce a plurality of rotated crystallographic orientations.