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기록

Metal Plated Conductive Elastomer Sort Probe

발명심사 중
20청구항 · 3 독립항
§ Ⅰ

개요

IPC 분류

G1R 1/67G1R 1/73G1R 3/

CPC 분류

G1R1/6716G1R1/6761G1R1/7314G1R3/

According to the various aspects, a testing probe may include an electrically conductive pad disposed on a substrate with an electrically conductive elastomer head disposed on the electrically conductive pad and a metal layer disposed on the electrically conductive elastomer head. In an aspect, a plurality of the testing probes are disposed on the substrate to form a probe head interposer.

원문 (중국어)

According to the various aspects, a testing probe may include an electrically conductive pad disposed on a substrate with an electrically conductive elastomer head disposed on the electrically conductive pad and a metal layer disposed on the electrically conductive elastomer head. In an aspect, a plurality of the testing probes are disposed on the substrate to form a probe head interposer.