TESTER AND TEST CONTROL DEVICE AND METHOD
개요
출원인
BEIJING HUAFENG TEST & CONTROL TECHNOLOGY CO., LTD.
발명자
Ning Ju; Xiaotong Zhang
IPC 분류
CPC 분류
The disclosure relates to a tester, a test control device and a test control method. The device comprises a parallel control unit and a plurality of station control units, wherein each of the station control units corresponds to at least one device under test. The parallel control unit is connected with the station control units and a host respectively and is configured to receive test items sent by the host and send each of test sequences in the test items to a station control unit corresponding to a device under test corresponding to the test sequence. Each of the station control units is connected with a plurality of function boards respectively, wherein functions realized by the function boards are different. Any station control unit is configured to send received test sequence(s) to corresponding function boards according to functions required to realize for the received test sequence(s).
원문 (중국어)
The disclosure relates to a tester, a test control device and a test control method. The device comprises a parallel control unit and a plurality of station control units, wherein each of the station control units corresponds to at least one device under test. The parallel control unit is connected with the station control units and a host respectively and is configured to receive test items sent by the host and send each of test sequences in the test items to a station control unit corresponding to a device under test corresponding to the test sequence. Each of the station control units is connected with a plurality of function boards respectively, wherein functions realized by the function boards are different. Any station control unit is configured to send received test sequence(s) to corresponding function boards according to functions required to realize for the received test sequence(s).