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기록

TEST INTERCONNECT TEMPERATURE CONTROL WITH GAS FLOW

발명심사 중
25청구항 · 2 독립항
§ Ⅰ

개요

발명자

James Ray HASTINGS; Karthik RANGANATHAN; Joe E. KOETH; Ethan Jeffrey CALVARIO CASTILLO

IPC 분류

G1R 31/28G1R 1/4

CPC 분류

G1R31/2877G1R1/458

Various embodiments include techniques for controlling temperature of a test socket in a test system. A temperature controller determines an input temperature associated with a reference device under test (DUT) mounted in the test socket. The temperature controller determines a flow rate of a gas based on the input temperature. The temperature controller adjusts a flow control valve to supply the gas to the reference DUT at the flow rate.

원문 (중국어)

Various embodiments include techniques for controlling temperature of a test socket in a test system. A temperature controller determines an input temperature associated with a reference device under test (DUT) mounted in the test socket. The temperature controller determines a flow rate of a gas based on the input temperature. The temperature controller adjusts a flow control valve to supply the gas to the reference DUT at the flow rate.