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기록

DSP CIRCUIT, TEST AND/OR MEASUREMENT INSTRUMENT, AND SIGNAL PROCESSING METHOD

발명심사 중
2조회수
20청구항 · 2 독립항
§ Ⅰ

개요

발명자

Andrew SCHAEFER; Victor ARROYO

IPC 분류

G6F 1/2G6F 1/3G6F 9/30

CPC 분류

G6F1/22G6F1/3G6F9/3001

A digital signal processing (DSP) circuit is described. The DSP circuit includes a signal input, a signal encoding circuit, a generative circuit, and a DSP function circuit. The signal input is configured to receive at least one input signal. The signal encoding circuit is configured to process the at least one input signal, wherein the signal encoding circuit is configured to map the at least one input signal to at least one signal characterization parameter. The generative circuit is configured to generate a set of measurement data based on the at least one signal characterization parameter, wherein the set of measurement data includes at least one measurement value. The DSP function circuit is configured to provide a DSP functionality. The DSP function circuit is configured to process and/or combine the set of measurement data, thereby obtaining a set of expedited output data.

원문 (중국어)

A digital signal processing (DSP) circuit is described. The DSP circuit includes a signal input, a signal encoding circuit, a generative circuit, and a DSP function circuit. The signal input is configured to receive at least one input signal. The signal encoding circuit is configured to process the at least one input signal, wherein the signal encoding circuit is configured to map the at least one input signal to at least one signal characterization parameter. The generative circuit is configured to generate a set of measurement data based on the at least one signal characterization parameter, wherein the set of measurement data includes at least one measurement value. The DSP function circuit is configured to provide a DSP functionality. The DSP function circuit is configured to process and/or combine the set of measurement data, thereby obtaining a set of expedited output data.