ADJUSTING TRIM SETTINGS TO IMPROVE MEMORY PERFORMANCE OR RELIABILITY
개요
발명자
Junichi Sato
IPC 분류
CPC 분류
A memory device stores data for a host. In one approach, a trim operation is initiated for the memory device (e.g., based on a context that is determined for the memory device). During the trim operation, read and/or write tests are performed on one or more portions of a non-volatile storage media of the memory device. One or more characteristics associated with the memory device are observed during the test. Based on these observed characteristics, one or more trim settings are determined. Then, the memory device is updated to store the determined trim settings to configure subsequent read or write access to the non-volatile storage media (e.g., access performed in response to commands from a host).
원문 (중국어)
A memory device stores data for a host. In one approach, a trim operation is initiated for the memory device (e.g., based on a context that is determined for the memory device). During the trim operation, read and/or write tests are performed on one or more portions of a non-volatile storage media of the memory device. One or more characteristics associated with the memory device are observed during the test. Based on these observed characteristics, one or more trim settings are determined. Then, the memory device is updated to store the determined trim settings to configure subsequent read or write access to the non-volatile storage media (e.g., access performed in response to commands from a host).