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기록

METHOD FOR LIFETIME PREDICTION AND MONITORING

발명심사 중
2조회수
14청구항 · 3 독립항
§ Ⅰ

개요

발명자

Thomas CHRISTEN; Felipe MACEDO

IPC 분류

G6N 5/22G6N 7/1

CPC 분류

G6N5/22G6N7/1

A method for lifetime prediction and monitoring of a device, and a corresponding system are provided. The method comprises calculating a probability density function over time for an aging variable based on solving equation(s) from an aging model with an End of Life (EOL) boundary condition, wherein the boundary condition includes a first boundary condition and a second boundary condition, wherein the first boundary condition is a no-flux boundary condition and the second boundary condition is an absorbing or partly absorbing boundary condition, measuring an condition related observable of the device; obtaining first data representing measurement of the observable, calculating a likelihood for the aging variable from the first data, updating the calculated probability density function of the aging variable based on the likelihood, and generating a signal indicating a health prediction of the device based on the probability density function, the aging model and the EOL boundary condition.

원문 (중국어)

A method for lifetime prediction and monitoring of a device, and a corresponding system are provided. The method comprises calculating a probability density function over time for an aging variable based on solving equation(s) from an aging model with an End of Life (EOL) boundary condition, wherein the boundary condition includes a first boundary condition and a second boundary condition, wherein the first boundary condition is a no-flux boundary condition and the second boundary condition is an absorbing or partly absorbing boundary condition, measuring an condition related observable of the device; obtaining first data representing measurement of the observable, calculating a likelihood for the aging variable from the first data, updating the calculated probability density function of the aging variable based on the likelihood, and generating a signal indicating a health prediction of the device based on the probability density function, the aging model and the EOL boundary condition.