SEMICONDUCTOR MEMORY DEVICE AND STACKED MEMORY DEVICE

원문 (중국어)

A semiconductor memory device includes a physical region, a direct access region and a power manager. The direct access region interfaces with an external test device directly. The power manager generates an internal power supply voltage based on one of a first power supply voltage, a second power supply voltage and a power supply voltage, and provides the internal power supply voltage to the direct access region. The power manager provides the second power supply voltage to the physical region. The direct access region includes a test interface circuit and the test interface circuit, in a direct access mode, generates an internal clock signal based on an external clock signal, generates an internal test clock signal by latching a test control signal received from the external test device based on the internal clock signal and provides the internal test control signal to the physical region.