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기록

SUBSTRATE PROCESSING METHOD

발명심사 중
6청구항 · 2 독립항
§ Ⅰ

개요

발명자

Kota TANIKAWA; Manabu TAKUSARI; Hiroyuki YASHIKI

IPC 분류

H1L 21/2B8B 3/4B8B 3/8H1L 21/67

CPC 분류

H1L21/2057B8B3/41B8B3/8H1L21/67051

A substrate processing method includes: holding a substrate having a first main surface and a second main surface; rotating the substrate and supplying a hydrofluoric acid-containing liquid to the second main surface of the substrate, the hydrofluoric acid-containing liquid containing hydrofluoric acid; after supplying the hydrofluoric acid-containing liquid to the second main surface of the substrate, rotating the substrate and supplying a rinse liquid to the second main surface of the substrate; and after supplying the rinse liquid to the second main surface of the substrate, rotating the substrate and supplying a hydrophobizing liquid to the first main surface of the substrate.

원문 (중국어)

A substrate processing method includes: holding a substrate having a first main surface and a second main surface; rotating the substrate and supplying a hydrofluoric acid-containing liquid to the second main surface of the substrate, the hydrofluoric acid-containing liquid containing hydrofluoric acid; after supplying the hydrofluoric acid-containing liquid to the second main surface of the substrate, rotating the substrate and supplying a rinse liquid to the second main surface of the substrate; and after supplying the rinse liquid to the second main surface of the substrate, rotating the substrate and supplying a hydrophobizing liquid to the first main surface of the substrate.