CNIPA.AI
검색으로 돌아가기
기록

SEMICONDUCTOR PACKAGING METHOD, SEMICONDUCTOR PACKAGE AND ELECTRONIC DEVICE

발명심사 중
10청구항 · 1 독립항
§ Ⅰ

개요

IPC 분류

H1L 23/498H1L 21/48H1L 21/56H1L 23/H1L 23/50H1L 23/538H1L 23/64H1L 25/7

CPC 분류

H1L23/49811H1L21/4853H1L21/56H1L23/50H1L23/538H1L23/642H1L24/14H1L24/16H1L25/72H1L2224/1413H1L2224/16225

A semiconductor packaging method, which utilizes a connection structure and an interconnection device to realize electrical connections between semiconductor devices and a power supply and the interconnection between the semiconductor devices. A capacitor is provided and is located on at least one side of the connection structure, and on at least one side of the interconnection device. Packaging the capacitor inside the semiconductor package and arranging it in a same layer as the connection structure and the interconnection device maintains the size of the semiconductor package, is conducive to miniaturization, shortens the distance between the capacitor and the semiconductor devices, and improving the effect of the capacitor in filtering high-frequency noise in the resulting circuit, which is conducive to improving the working stability of the semiconductor devices.

원문 (중국어)

A semiconductor packaging method, which utilizes a connection structure and an interconnection device to realize electrical connections between semiconductor devices and a power supply and the interconnection between the semiconductor devices. A capacitor is provided and is located on at least one side of the connection structure, and on at least one side of the interconnection device. Packaging the capacitor inside the semiconductor package and arranging it in a same layer as the connection structure and the interconnection device maintains the size of the semiconductor package, is conducive to miniaturization, shortens the distance between the capacitor and the semiconductor devices, and improving the effect of the capacitor in filtering high-frequency noise in the resulting circuit, which is conducive to improving the working stability of the semiconductor devices.