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기록

ERROR CORRECTION DEVICE, ERROR CORRECTION METHOD, AND CONTROL CIRCUIT

발명심사 중
3청구항 · 3 독립항
§ Ⅰ

개요

발명자

Hideo YOSHIDA; Kenji ISHII; Kiyoshi ONOHARA

IPC 분류

H3M 13/15

CPC 분류

H3M13/1575

An error correction device includes a hard decision value extraction unit that extracts a hard decision value from a soft decision received-sequence containing soft decision information, and outputs, as a hard decision received-sequence, a hard decision value sequence that has been extracted; a test pattern position candidate selection unit that determines, on the basis of the soft decision information, test pattern position candidates, which are each a position of application of a test pattern to the hard decision received-sequence; and a simulated correction operation unit that performs, in parallel, generation of multiple test patterns to be applied at the test pattern position candidates, and error correction operations using the test patterns generated, on the hard decision received-sequence.

원문 (중국어)

An error correction device includes a hard decision value extraction unit that extracts a hard decision value from a soft decision received-sequence containing soft decision information, and outputs, as a hard decision received-sequence, a hard decision value sequence that has been extracted; a test pattern position candidate selection unit that determines, on the basis of the soft decision information, test pattern position candidates, which are each a position of application of a test pattern to the hard decision received-sequence; and a simulated correction operation unit that performs, in parallel, generation of multiple test patterns to be applied at the test pattern position candidates, and error correction operations using the test patterns generated, on the hard decision received-sequence.