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기록

MEMORY DEVICE AND MANUFACTURING METHOD OF THE MEMORY DEVICE

발명심사 중
1조회수
26청구항 · 1 독립항
§ Ⅰ

개요

발명자

Do Young KIM; Jin Ha KIM; Changhan Kim

IPC 분류

H10B 43/27H10B 43/35

CPC 분류

H10B43/27H10B43/35

A memory device includes conductive patterns and first interlayer insulating layers stacked alternately with each other in a first direction, a dummy pattern separated from the conductive patterns in the first direction, a second interlayer insulating layer located between the conductive patterns and the dummy pattern, protruding patterns protruding in a second direction crossing the first direction from side surfaces of the first interlayer insulating layers and a side surface of the second interlayer insulating layer, and data storage patterns located between the protruding patterns.

원문 (중국어)

A memory device includes conductive patterns and first interlayer insulating layers stacked alternately with each other in a first direction, a dummy pattern separated from the conductive patterns in the first direction, a second interlayer insulating layer located between the conductive patterns and the dummy pattern, protruding patterns protruding in a second direction crossing the first direction from side surfaces of the first interlayer insulating layers and a side surface of the second interlayer insulating layer, and data storage patterns located between the protruding patterns.