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기록

METHOD OF FABRICATING SEMICONDUCTOR MEMORY DEVICE

발명심사 중
20청구항 · 3 독립항
§ Ⅰ

개요

출원인

Samsung Electronics Co., Ltd.

발명자

Yong Jae LEE; Seul Ji SONG

IPC 분류

H10B 63/H10N 70/

CPC 분류

H10B63/24H10B63/84H10N70/841

A method of fabricating a semiconductor memory device includes forming a first electrode on a substrate; forming an OTS film on the first electrode; forming a second electrode on the OTS film. The OTS film includes a first surface that is in contact with the first electrode and a second surface that is in contact with the second electrode. An area of the first surface and an area of the second surface are different from each other.

원문 (중국어)

A method of fabricating a semiconductor memory device includes forming a first electrode on a substrate; forming an OTS film on the first electrode; forming a second electrode on the OTS film. The OTS film includes a first surface that is in contact with the first electrode and a second surface that is in contact with the second electrode. An area of the first surface and an area of the second surface are different from each other.