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기록

SEMICONDUCTOR DEVICES WITH INSULATION FEATURES

발명심사 중
20청구항 · 3 독립항
§ Ⅰ

개요

발명자

Tzu-Ging Lin

IPC 분류

H1L 29/66H1L 29/6H1L 29/417H1L 29/423H1L 29/775H1L 29/786

CPC 분류

H10D30/14H10D30/43H10D30/6729H10D30/6735H10D30/6757H10D62/121H10D64/17H10D64/18

Semiconductor devices with insulation structures and methods of fabrication are provided. A method includes forming fins over a substrate; forming a gate over the fins, wherein a sidewall spacer is laterally adjacent to the gate; removing an upper portion of the sidewall spacer; forming a cavity by removing a selected segment of the gate and removing a selected fin located under the selected segment; and forming an insulation feature in the cavity.

원문 (중국어)

Semiconductor devices with insulation structures and methods of fabrication are provided. A method includes forming fins over a substrate; forming a gate over the fins, wherein a sidewall spacer is laterally adjacent to the gate; removing an upper portion of the sidewall spacer; forming a cavity by removing a selected segment of the gate and removing a selected fin located under the selected segment; and forming an insulation feature in the cavity.