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기록

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD

발명심사 중
1조회수
18청구항 · 3 독립항
§ Ⅰ

개요

발명자

Gianpaolo ROMANO; Andrei MIHAILA; Giovanni ALFIERI; Yulieth Cristina ARANGO

IPC 분류

H10D 62/10H10D 12/H10D 12/1H10D 30/1H10D 30/66H10D 62/60H10D 62/832

CPC 분류

H10D62/116H10D12/32H10D12/38H10D12/441H10D12/481H10D30/291H10D30/297H10D30/66H10D30/668H10D62/102H10D62/103H10D62/124H10D62/60H10D62/8325

In one embodiment, the semiconductor device () comprises a semiconductor body (), a gate electrode () and a first electrode (), wherein—the semiconductor body () comprises a first region () which is a source region or an emitter region, and comprises a well region (), the first region () is of a first conductivity type and the well region () is of a different, second conductivity type,—the well region () is separated from the gate electrode () by a gate insulator layer (),—the first region () is electrically contacted by means of the first electrode () which is a source electrode or an emitter electrode,—in the first region () there is at least one current limiting region (), and—the at least one current limiting region () is of at least one electrically insulating material.

원문 (중국어)

In one embodiment, the semiconductor device () comprises a semiconductor body (), a gate electrode () and a first electrode (), wherein—the semiconductor body () comprises a first region () which is a source region or an emitter region, and comprises a well region (), the first region () is of a first conductivity type and the well region () is of a different, second conductivity type,—the well region () is separated from the gate electrode () by a gate insulator layer (),—the first region () is electrically contacted by means of the first electrode () which is a source electrode or an emitter electrode,—in the first region () there is at least one current limiting region (), and—the at least one current limiting region () is of at least one electrically insulating material.