SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
개요
발명자
Naoki KUNESHITA
IPC 분류
CPC 분류
A semiconductor device includes: a drift layer of a first conductivity-type provided in an active area and an edge termination area surrounding the active area; a base region of a second conductivity-type provided on a top surface side of the drift layer in the active area; a main region of the first conductivity-type provided on a top surface side of the base region; and an insulated gate electrode structure provided in contact with the main region and the base region, wherein an effective carrier concentration in the base region is relatively high in a middle part of the active area and is relatively low in a circumferential part of the active area, and a depth of a peak concentration in the base region is deeper than a bottom surface of the main region.
원문 (중국어)
A semiconductor device includes: a drift layer of a first conductivity-type provided in an active area and an edge termination area surrounding the active area; a base region of a second conductivity-type provided on a top surface side of the drift layer in the active area; a main region of the first conductivity-type provided on a top surface side of the base region; and an insulated gate electrode structure provided in contact with the main region and the base region, wherein an effective carrier concentration in the base region is relatively high in a middle part of the active area and is relatively low in a circumferential part of the active area, and a depth of a peak concentration in the base region is deeper than a bottom surface of the main region.