Measuring system and method for three-dimensional object
데이터 출처: EPO OPS
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개요
출원 번호
CN202310268397
발명자
XIANG XIAODONG; HU HUI; CHEN HAI
출원일
Mar 14, 2023
공개일
Sep 20, 2024
특허 패밀리 ID
92720100
IPC 분류
CPC 분류
The embodiment of the invention provides a system and method for measuring a three-dimensional object, and the system comprises a line laser transmitting module which is used for projecting at least two line lasers to a measured surface of the three-dimensional object, and the line lasers are modulated line lasers; the line laser acquisition module is used for acquiring the brightness change of each modulated line laser on the measured surface of the three-dimensional object and correspondingly generating an event; and the three-dimensional reconstruction module is used for matching the modulated line laser according to the generated event and calculating the measured surface information of the three-dimensional object according to the matched modulated line laser. And the accuracy of multi-line laser measurement of three-dimensional information can be effectively improved.
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