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기록

Measuring system and method for three-dimensional object

기타 / 미제공알 수 없음

데이터 출처: EPO OPS

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92720100패밀리
§ Ⅰ

개요

출원인

HUAWEI TECH CO LTD

출원 번호

CN202310268397

발명자

XIANG XIAODONG; HU HUI; CHEN HAI

출원일

Mar 14, 2023

공개일

Sep 20, 2024

특허 패밀리 ID

92720100

IPC 분류

G01B11/25

CPC 분류

G01B11/25

The embodiment of the invention provides a system and method for measuring a three-dimensional object, and the system comprises a line laser transmitting module which is used for projecting at least two line lasers to a measured surface of the three-dimensional object, and the line lasers are modulated line lasers; the line laser acquisition module is used for acquiring the brightness change of each modulated line laser on the measured surface of the three-dimensional object and correspondingly generating an event; and the three-dimensional reconstruction module is used for matching the modulated line laser according to the generated event and calculating the measured surface information of the three-dimensional object according to the matched modulated line laser. And the accuracy of multi-line laser measurement of three-dimensional information can be effectively improved.

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