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기록

Coating thickness detection method and device, computer readable storage medium and system

기타 / 미제공알 수 없음

데이터 출처: EPO OPS

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92774784패밀리
§ Ⅰ

개요

출원인

NINGDE CONTEMPORARY AMPEREX TECH CO LTD

출원 번호

CN202411171306

발명자

HUANG YUNLONG; HUI TAO; LIU ZHIWEN; CHEN XI

출원일

Aug 26, 2024

공개일

Sep 24, 2024

특허 패밀리 ID

92774784

IPC 분류

G01B11/02G01B11/06

CPC 분류

G01B11/026G01B11/0616G01B11/0625Y02E60/10

The invention relates to a coating thickness detection method and device, a computer readable storage medium and a system. The method comprises the following steps: acquiring first distance information between a time-domain spectrum probe and an alignment point on a pole piece coating and coating thickness information at the alignment point acquired by the time-domain spectrum probe; acquiring a plurality of pieces of phase difference information acquired by the frequency domain spectrum probe array; and performing thickness detection according to the first distance information, the coating thickness information at the alignment point and the plurality of pieces of phase difference information to obtain coating thickness information at a plurality of non-alignment points. According to the invention, the accuracy of coating thickness measurement can be improved.

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