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기록

Method and device for detecting surface defects of product

기타 / 미제공알 수 없음

데이터 출처: EPO OPS

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89705071패밀리
§ Ⅰ

개요

출원인

NINGDE CONTEMPORARY AMPEREX TECH CO LTD

출원 번호

CN20228091450

발명자

CHEN XIAOYI; JIANG GUANNAN; CHEN FEI

출원일

Jul 29, 2022

공개일

Sep 24, 2024

특허 패밀리 ID

89705071

IPC 분류

G06N3/0464G06N3/08G06T7/00G06T7/11G06V10/40

CPC 분류

G06N3/04G06N3/08G06T7/00G06V10/40

The invention discloses a method and a device for detecting surface defects of a product, which can reduce the calculated amount and improve the detection efficiency while accurately segmenting a defect area on the surface of the product. The method for detecting surface defects of a product comprises: acquiring a first picture of a product (S210); according to the first picture and a region segmentation model, obtaining a defect region of the product (S220), the region segmentation model comprising a plurality of data processing layers, the plurality of data processing layers being connected by performing sampling calculation on data to be sampled, the to-be-sampled data of the at least one data processing layer is obtained by splicing first intermediate data generated by input data of the data processing layer and second intermediate data generated by the first intermediate data.

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