Method and device for detecting surface defects of product
데이터 출처: EPO OPS
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개요
출원 번호
CN20228091450
발명자
CHEN XIAOYI; JIANG GUANNAN; CHEN FEI
출원일
Jul 29, 2022
공개일
Sep 24, 2024
특허 패밀리 ID
89705071
IPC 분류
CPC 분류
The invention discloses a method and a device for detecting surface defects of a product, which can reduce the calculated amount and improve the detection efficiency while accurately segmenting a defect area on the surface of the product. The method for detecting surface defects of a product comprises: acquiring a first picture of a product (S210); according to the first picture and a region segmentation model, obtaining a defect region of the product (S220), the region segmentation model comprising a plurality of data processing layers, the plurality of data processing layers being connected by performing sampling calculation on data to be sampled, the to-be-sampled data of the at least one data processing layer is obtained by splicing first intermediate data generated by input data of the data processing layer and second intermediate data generated by the first intermediate data.
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