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案件記録

SENSOR WITH MICROSTRUCTURE

発明審査中
13請求項 · 3 独立
§ Ⅰ

案件概要

IPC分類

G1L 1/22H1C 17/65

CPC分類

G1L1/2287G1L1/2268H1C17/65

A force sensor () and a method for measuring a force are disclosed. The force sensor () comprises a first non-conductive substrate () and a second non-conductive substrate (). A first electrode () and a second electrode () are disposed on the first substrate () and offset to each other. A first conductive layer () is disposed on the first substrate () and is conductively connecting the first electrode () and the second electrode () with a first layer resistance (R). A second conductive layer () is disposed on the second substrate (). The second conductive layer () is configured to conductively connect the first electrode () and the second electrode () via the second conductive layer () with a second layer resistance (R) when the first non-conductive substrate () and the second non-conductive substrate () approach each other.

原文(中国語)

A force sensor () and a method for measuring a force are disclosed. The force sensor () comprises a first non-conductive substrate () and a second non-conductive substrate (). A first electrode () and a second electrode () are disposed on the first substrate () and offset to each other. A first conductive layer () is disposed on the first substrate () and is conductively connecting the first electrode () and the second electrode () with a first layer resistance (R). A second conductive layer () is disposed on the second substrate (). The second conductive layer () is configured to conductively connect the first electrode () and the second electrode () via the second conductive layer () with a second layer resistance (R) when the first non-conductive substrate () and the second non-conductive substrate () approach each other.

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