TEST APPARATUS AND TEST COVER THEREOF
卷宗概要
申请人
SILICONWARE PRECISION INDUSTRIES CO., LTD.
发明人
Wu-Su CHEN; Shih-Sheng LUO; Hui-Lung CHEN; Tz-Chi YU
IPC 分类
CPC 分类
A test apparatus and a test cover thereof are provided for electrical testing of a relay on a carrier board. The test cover includes a sleeve and a plurality of contacts. The sleeve is used to sleeve-couple to the relay. The plurality of contacts are disposed at an end of the sleeve and protrude from the sleeve and are used to contact and be electrically connected to a plurality of pins of the relay when the sleeve is sleeve-coupled to the relay for electrical testing. The test apparatus is capable of performing directly electrical test on the relay on the carrier board without the need for desoldering or dismantling the relay prior to performing electrical test. Therefore, the time required for addressing abnormal events during electronic component testing can be reduced, and the hazards associated with desoldering or dismantling the carrier board can be prevented.
原文(中文)
A test apparatus and a test cover thereof are provided for electrical testing of a relay on a carrier board. The test cover includes a sleeve and a plurality of contacts. The sleeve is used to sleeve-couple to the relay. The plurality of contacts are disposed at an end of the sleeve and protrude from the sleeve and are used to contact and be electrically connected to a plurality of pins of the relay when the sleeve is sleeve-coupled to the relay for electrical testing. The test apparatus is capable of performing directly electrical test on the relay on the carrier board without the need for desoldering or dismantling the relay prior to performing electrical test. Therefore, the time required for addressing abnormal events during electronic component testing can be reduced, and the hazards associated with desoldering or dismantling the carrier board can be prevented.