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案件記録

CHEMICALLY AMPLIFIED NEGATIVE RESIST COMPOSITION AND RESIST PATTERN FORMING PROCESS

発明審査中
20請求項 · 1 独立
§ Ⅰ

案件概要

発明者

Masahiro Fukushima; Satoshi Watanabe; Kenji Funatsu; Keiichi Masunaga; Masaaki Kotake; Yuta Matsuzawa

IPC分類

G3F 7/38G3F 7/20G3F 7/32

CPC分類

G3F7/382G3F7/2059G3F7/322

A chemically amplified negative resist composition contains (A) a base polymer containing a polymer which contains a repeat unit having formula (A1) and a repeat unit having formula (A2). The polymer is adapted to decrease its solubility in an aqueous alkaline solution under an action of an acid. The polymer may serve as a polymer-bound acid generator.

原文(中国語)

A chemically amplified negative resist composition contains (A) a base polymer containing a polymer which contains a repeat unit having formula (A1) and a repeat unit having formula (A2). The polymer is adapted to decrease its solubility in an aqueous alkaline solution under an action of an acid. The polymer may serve as a polymer-bound acid generator.

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