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案件記録

METAL INTERCONNECTION LINE AND MANUFACTURING METHOD THEREFOR

発明審査中
1閲覧数
13請求項 · 1 独立
§ Ⅰ

案件概要

発明者

Zhongkui CHEN; Fanshun MENG

IPC分類

H1L 21/3213

CPC分類

H1L21/32135

The present invention provides a metal interconnection line and a method of manufacturing the same. The method includes: providing a wafer on which a metal layer comprising an Al layer is formed; performing an ME process on the Al layer using a chlorine-containing gas, thereby removing a partial thickness of the Al layer and producing AlCl; performing a gradient OE process on the remainder of the Al layer using the chlorine-containing gas and a fluorine-containing gas, thereby removing an undesired part of the remainder of the Al layer and forming an Al interconnection line, wherein in the gradient OE process, a proportion of the fluorine-containing gas is increased stepwise to exchange the AlClfor AlF; and soaking the wafer in an NHF solution to remove the AlF. According to the present invention, Cl− ions remaining on the surface of the Al interconnection line from the etching processes for forming the line can be completely removed, preventing corrosion of the Al interconnection line.

原文(中国語)

The present invention provides a metal interconnection line and a method of manufacturing the same. The method includes: providing a wafer on which a metal layer comprising an Al layer is formed; performing an ME process on the Al layer using a chlorine-containing gas, thereby removing a partial thickness of the Al layer and producing AlCl; performing a gradient OE process on the remainder of the Al layer using the chlorine-containing gas and a fluorine-containing gas, thereby removing an undesired part of the remainder of the Al layer and forming an Al interconnection line, wherein in the gradient OE process, a proportion of the fluorine-containing gas is increased stepwise to exchange the AlClfor AlF; and soaking the wafer in an NHF solution to remove the AlF. According to the present invention, Cl− ions remaining on the surface of the Al interconnection line from the etching processes for forming the line can be completely removed, preventing corrosion of the Al interconnection line.

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