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案件記録

POWER SEMICONDUCTOR PACKAGE AND FABRICATION METHOD THEREOF

発明審査中
20請求項 · 2 独立
§ Ⅰ

案件概要

発明者

Yan-Wei Chen; Chih-Jen Su

IPC分類

H1L 23/H1L 21/56H1L 23/15H1L 23/31H1L 23/498

CPC分類

H1L24/29H1L21/561H1L23/15H1L23/3121H1L24/32H1L24/83H1L24/96H1L24/97H1L23/49866H1L24/48H1L24/73H1L2224/29082H1L2224/29139H1L2224/32058H1L2224/32059H1L2224/32227H1L2224/48227H1L2224/73265H1L2224/83192H1L2224/8384H1L2224/96H1L2224/97H1L2924/35121

A power semiconductor package includes a substrate; a chip affixed to the substrate via a dual-layer sintered silver bonding structure; and an epoxy molding compound that at least encapsulates the chip and a portion of the dual-layer sintered silver bonding structure. The dual-layer sintered silver bonding structure includes a first sintered silver layer positioned on the substrate, and a second sintered silver layer positioned on the first sintered silver layer, with the chip located on the second sintered silver layer. The first sintered silver layer has a porosity of less than 5%, and the second sintered silver layer has a Young's modulus of less than 20 GPa.

原文(中国語)

A power semiconductor package includes a substrate; a chip affixed to the substrate via a dual-layer sintered silver bonding structure; and an epoxy molding compound that at least encapsulates the chip and a portion of the dual-layer sintered silver bonding structure. The dual-layer sintered silver bonding structure includes a first sintered silver layer positioned on the substrate, and a second sintered silver layer positioned on the first sintered silver layer, with the chip located on the second sintered silver layer. The first sintered silver layer has a porosity of less than 5%, and the second sintered silver layer has a Young's modulus of less than 20 GPa.

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