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SYSTEM, METHOD AND APPARATUS FOR AUTOMATIC DETECTION AND RESOLUTION OF RADIO INTERFERENCE

발명심사 중
20청구항 · 2 독립항
§ Ⅰ

개요

발명자

Rami A. Al-Ghanim; Abdullah Y. Al-Hassan; Mohsen F. Al-Shammari; Firas A. Al-Kaud

IPC 분류

H4W 24/4H4B 17/345

CPC 분류

H4W24/4H4B17/345

A communication system for automatic detection and resolution of radio interference comprises a base station set on a primary frequency, sensors adapted to detect current parameters of the base station including interference on the primary frequency and a processor configured to generate a signal based on sensor output. A set of relays coupled to base station and includes a pooling relay is configured to switch the primary frequency to one of a pool of available secondary frequencies upon detection by the sensor of interference on the primary frequency. A centralized monitoring device processes the current parameters to determine whether the parameters indicate a defect at the base station, and sends notifications in response to the determination of the defect. An AI processor is configured to train and execute a first machine learning model that uses the parameter information and to output a classification of a cause of a defect.

원문 (중국어)

A communication system for automatic detection and resolution of radio interference comprises a base station set on a primary frequency, sensors adapted to detect current parameters of the base station including interference on the primary frequency and a processor configured to generate a signal based on sensor output. A set of relays coupled to base station and includes a pooling relay is configured to switch the primary frequency to one of a pool of available secondary frequencies upon detection by the sensor of interference on the primary frequency. A centralized monitoring device processes the current parameters to determine whether the parameters indicate a defect at the base station, and sends notifications in response to the determination of the defect. An AI processor is configured to train and execute a first machine learning model that uses the parameter information and to output a classification of a cause of a defect.