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MEMORY DEVICE AND MANUFACTURING METHOD OF THE MEMORY DEVICE

发明专利审中
26权利要求 · 1 独立
§ Ⅰ

卷宗概要

申请人

SK hynix Inc.

发明人

Do Young KIM; Jin Ha KIM; Changhan Kim

IPC 分类

H10B 43/27H10B 43/35

CPC 分类

H10B43/27H10B43/35

A memory device includes conductive patterns and first interlayer insulating layers stacked alternately with each other in a first direction, a dummy pattern separated from the conductive patterns in the first direction, a second interlayer insulating layer located between the conductive patterns and the dummy pattern, protruding patterns protruding in a second direction crossing the first direction from side surfaces of the first interlayer insulating layers and a side surface of the second interlayer insulating layer, and data storage patterns located between the protruding patterns.

原文(中文)

A memory device includes conductive patterns and first interlayer insulating layers stacked alternately with each other in a first direction, a dummy pattern separated from the conductive patterns in the first direction, a second interlayer insulating layer located between the conductive patterns and the dummy pattern, protruding patterns protruding in a second direction crossing the first direction from side surfaces of the first interlayer insulating layers and a side surface of the second interlayer insulating layer, and data storage patterns located between the protruding patterns.