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Dossier
TEMPERATURE PROFILING CIRCUIT AND METHOD FOR DETERMINING A TEMPERATURE PROFILE
InventionPending
§ Ⅰ
Dossier Overview
Applicant
NXP USA, Inc.
Inventor
Ryabchenkov,, Sergey Sergeevich; Kandah,, Ibrahim Shihadeh; Storez,, Antoine
Filing Date
Jul 4, 2024
Publication Date
Jan 6, 2026
IPC Classification
G01KG01KG01KG01KG01KG01R
CPC Classification
G01KG01KG01KG01KG01K
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