DEFECT ESTIMATION DEVICE, NUMERICAL CONTROL DEVICE, ADDITIVE MANUFACTURING APPARATUS, AND DEFECT ESTIMATION METHOD
Dossier Overview
Applicant
Mitsubishi Electric Corporation
Inventor
Yoshiyuki MATSUI; Nobuyuki SUMI; Shun KAYASHIMA
IPC Classification
CPC Classification
A defect estimation device estimates a state of an internal defect that is a gap formed inside an object manufactured by supplying a material to a workpiece and stacking beads formed of the material melted using a beam. The defect estimation device includes a defect estimation unit that determines presence or absence of at least one of a first phenomenon that is a phenomenon in which the material unmelted collides with the workpiece, a second phenomenon that is a phenomenon in which the material unmelted is rubbed against the bead to generate a trace on the bead, and a third phenomenon that is a phenomenon in which a gap is generated between beads adjacent to each other, and obtains defect information indicating the state of the internal defect based on a determination result.
Original (Chinese)
A defect estimation device estimates a state of an internal defect that is a gap formed inside an object manufactured by supplying a material to a workpiece and stacking beads formed of the material melted using a beam. The defect estimation device includes a defect estimation unit that determines presence or absence of at least one of a first phenomenon that is a phenomenon in which the material unmelted collides with the workpiece, a second phenomenon that is a phenomenon in which the material unmelted is rubbed against the bead to generate a trace on the bead, and a third phenomenon that is a phenomenon in which a gap is generated between beads adjacent to each other, and obtains defect information indicating the state of the internal defect based on a determination result.
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