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案件記録

SYSTEM FOR INSPECTING DISPLAY PANEL, METHOD OF INSPECTING DISPLAY PANEL AND ELECTRONIC DEVICE

発明審査中
21請求項 · 3 独立
§ Ⅰ

案件概要

発明者

Jae Hyung PARK; Jin Tea KIM; Sang Wook BAEK; Ki Soo CHUNG; Hee Dok CHOI

IPC分類

G1N 27/72H4N 17/

CPC分類

G1N27/72H4N17/4

A system for inspecting a display panel includes at least one carrier, at least one display panel respectively loaded on the at least one carrier, an inspection base including a plurality of inspection lines each extending in a first direction, wherein at least one of the plurality of inspection lines overlaps with a path through which the at least one carrier is configured to move, first coils overlapping with the plurality of inspection lines, second coils not overlapping with the plurality of inspection lines, and a plurality of inspection devices respectively overlapping with the plurality of inspection lines on a plane and configured to inspect the at least one display panel.

原文(中国語)

A system for inspecting a display panel includes at least one carrier, at least one display panel respectively loaded on the at least one carrier, an inspection base including a plurality of inspection lines each extending in a first direction, wherein at least one of the plurality of inspection lines overlaps with a path through which the at least one carrier is configured to move, first coils overlapping with the plurality of inspection lines, second coils not overlapping with the plurality of inspection lines, and a plurality of inspection devices respectively overlapping with the plurality of inspection lines on a plane and configured to inspect the at least one display panel.

外部リソース