METHOD FOR EXTRACTING MODEL PARAMETER OF INTEGRATED CIRCUIT DEVICE, APPARATUS AND STORAGE MEDIUM

Original (Chinese)

A method for extracting a model parameter of an integrated circuit device, an apparatus and a storage medium. The method includes providing a test data set and a simulated data set for an integrated circuit device; providing a setting interface including a data checking list and a data extraction list; a user setting the data checking list of a setting interface; generating at least one data checking task on the basis of a user input setting, and performing rule checking on a test data set and a simulated data set according to a pre-stored data checking package, automatically marking, and generating one new target data set; a user setting the data extraction list of the setting interface and extracting parameters of one or more newly generated target data sets; and modeling according to the parameters extracted according to the data extraction list.