Abnormality detection method and device, electronic equipment, medium and product
Source: EPO OPS
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Dossier Overview
Applicant
NINGDE CONTEMPORARY AMPEREX TECH CO LTD; NINGDE SHIDAI RUNZHI SOFTWARE TECH CO LTD
Application number
CN202410932435
Inventor
HOU XINGYU; GAO XINYU; WANG JIAOJIAN; ZHANG XUEMIN; DU MIAN
Filing Date
Jul 12, 2024
Publication Date
Aug 9, 2024
Patent Family ID
92167277
IPC Classification
CPC Classification
The invention discloses an anomaly detection method and device, electronic equipment, a medium and a product. The method comprises the steps that multiple pieces of first data of target equipment running in a first time period are acquired; sorting the plurality of pieces of first data according to acquisition moments to obtain a first sequence; intercepting data in the first sequence according to a second time period to obtain a second sequence, the duration of the first time period being greater than that of the second time period, and the starting moment or the ending moment of the second time period being within the first time period; acquiring a data offset degree of the data in the second sequence relative to the data in the first sequence; and judging whether the operation of the target equipment in the second time period is abnormal or not based on the data offset degree. According to the detection mode, the interference of abnormal operation caused by the use loss of the target equipment can be avoided, and the accuracy of abnormal detection is improved.
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