Industrial defect detection method and related equipment
Source: EPO OPS
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Dossier Overview
Application number
CN202310181576
Inventor
HA QIAN
Filing Date
Feb 20, 2023
Publication Date
Aug 20, 2024
Patent Family ID
92278400
IPC Classification
CPC Classification
The invention provides an industrial defect detection method and related equipment. Specifically, the detection method comprises the following steps: acquiring image information of a to-be-detected object; determining a to-be-detected pixel point and a corresponding standard line according to the image information; calculating the distance between the pixel point to be detected and the standard line; and according to a preset defect judgment rule and the distance, determining whether the to-be-detected object has a defect and a corresponding defect position. Therefore, automatic judgment and positioning of defects are realized, and the technical effects of efficient detection and cost saving are achieved.
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