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Industrial defect detection method and related equipment

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Source: EPO OPS

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92278400Family
§ Ⅰ

Dossier Overview

Applicant

BEIJING BOE TECHNOLOGY DEV CO LTD; BOE TECHNOLOGY GROUP CO LTD

Application number

CN202310181576

Inventor

HA QIAN

Filing Date

Feb 20, 2023

Publication Date

Aug 20, 2024

Patent Family ID

92278400

IPC Classification

G01N21/88

CPC Classification

G01N21/88

The invention provides an industrial defect detection method and related equipment. Specifically, the detection method comprises the following steps: acquiring image information of a to-be-detected object; determining a to-be-detected pixel point and a corresponding standard line according to the image information; calculating the distance between the pixel point to be detected and the standard line; and according to a preset defect judgment rule and the distance, determining whether the to-be-detected object has a defect and a corresponding defect position. Therefore, automatic judgment and positioning of defects are realized, and the technical effects of efficient detection and cost saving are achieved.

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