Measuring system and method for three-dimensional object
Source: EPO OPS
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Dossier Overview
Application number
CN202310268397
Inventor
XIANG XIAODONG; HU HUI; CHEN HAI
Filing Date
Mar 14, 2023
Publication Date
Sep 20, 2024
Patent Family ID
92720100
IPC Classification
CPC Classification
The embodiment of the invention provides a system and method for measuring a three-dimensional object, and the system comprises a line laser transmitting module which is used for projecting at least two line lasers to a measured surface of the three-dimensional object, and the line lasers are modulated line lasers; the line laser acquisition module is used for acquiring the brightness change of each modulated line laser on the measured surface of the three-dimensional object and correspondingly generating an event; and the three-dimensional reconstruction module is used for matching the modulated line laser according to the generated event and calculating the measured surface information of the three-dimensional object according to the matched modulated line laser. And the accuracy of multi-line laser measurement of three-dimensional information can be effectively improved.
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