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Measuring system and method for three-dimensional object

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Source: EPO OPS

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92720100Family
§ Ⅰ

Dossier Overview

Applicant

HUAWEI TECH CO LTD

Application number

CN202310268397

Inventor

XIANG XIAODONG; HU HUI; CHEN HAI

Filing Date

Mar 14, 2023

Publication Date

Sep 20, 2024

Patent Family ID

92720100

IPC Classification

G01B11/25

CPC Classification

G01B11/25

The embodiment of the invention provides a system and method for measuring a three-dimensional object, and the system comprises a line laser transmitting module which is used for projecting at least two line lasers to a measured surface of the three-dimensional object, and the line lasers are modulated line lasers; the line laser acquisition module is used for acquiring the brightness change of each modulated line laser on the measured surface of the three-dimensional object and correspondingly generating an event; and the three-dimensional reconstruction module is used for matching the modulated line laser according to the generated event and calculating the measured surface information of the three-dimensional object according to the matched modulated line laser. And the accuracy of multi-line laser measurement of three-dimensional information can be effectively improved.

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